Research Interests |
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VCSEL-based self-mixing sensors for biomedical applicationsThe self-mixing phenomenon occurs when the laser beam is
partially reflected from an external target and injected back into
the laser cavity. The reflected light interferes or ‘mixes’ with the
light inside the laser cavity and produces variations to the
threshold gain, emitted power, lasing spectrum and the laser
junction voltage. The resulting output power variations are usually
monitored by using the photodiode integrated within the laser
package. This phenomenon allows the laser to be used as an
interferometric sensor incorporating the light source and the
interferometer in one device thus significantly reducing the cost
and the complexity of the sensing system. Representative publications:
Y. L. Lim, R. Kliese, K. Bertling, K. Tanimizu, P. A. Jacobs and A. D. Rakić, “Self-mixing flow sensor using a monolithic VCSEL array with parallel readout” Optics Express, 18 (11), 11720-11727, (2010)
R. Kliese, Y. L. Lim, T. Bosch, and A. D. Rakić, “GaN laser self-mixing velocimeter for measuring slow flows” Opt. Lett.. 35 (6), 814-816, (2010)
Y. L. Lim, M. Nikolic, K. Bertling, R. Kliese, and A. D. Rakic, "Self-mixing imaging sensor using a monolithic VCSEL array with parallel readout," Optics Express, 17 (7) 5517-5525, (2009).
J. R. Tucker, A. D. Rakić, C. J. O’Brien, A. V. Zvyagin “The effect of multiple transverse modes in self-mixing sensors based on Vertical-Cavity Surface-Emitting Lasers,” Appl. Opt. 46 (4), 611-619 (2007)
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Optical Interconnects using Arrays of Vertical-Cavity Surface-Emitting LasersThis work is concerned with the design and implementation of free-space optical interconnects to replace conventional copper wire type interconnects commonly used in the current computer technology. While the interconnect channel density (number of channels/mm2) and delay are important factors for many digital computers, crosstalk and noise associated with increasing channel densities and currents are becoming a larger problem.The advantage of optical interconnects are that they would allow higher operational speed (GB/s), better Bit-Error-Ratio (BER), and reduced power consumption in comparison with the existing electrical interconnects in computer systems. We have developed design oriented models for microchannel and hybrid optical interconnect architectures based on Vertical-Cavity Surface-Emitting Laser (VCSEL) arrays. Applied Optics Vol 46, Issue 13, May 2007 (cover page)Representative publications: F-C. F. Tsai, C. J. O’Brien, N. S. Petrovic, A. D. Rakić, “Analysis of hexagonal array geometry for free-space optical interconnects with improved signal-to-noise ratio,” Appl. Opt. 46 (13), 2434-2442 (2007) F-C. F. Tsai, C. J. O’Brien, N. S. Petrović, A. D. Rakić, “Analysis of optical channel crosstalk for free-space optical interconnects in the presence of higher order transverse modes,” Appl. Opt. 44 (30), 6380-6387 (2005) |
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Design and Modelling of Organic Microcavity Light Emitting DiodesWe are working on modelling, design, and optimisation of novel organic light emitting structures. Project is being conducted in collaboration with Prof Djurisic's group at The University of Hong-Kong, Hong-Kong, China and draws on our earlier successful work on compound semiconductor materials for surface-normal light emitters. Representative publications: C. H. Cheung, A. B.
Djurišić, C. Y. Kwong, J. Chan, A. D. Rakić, H. L. Tam, K. W.
Cheah, Z. T. Liu, W. K. Chan, and P. C. Chui, “Dependence of the
emission from tris(8-hydroxyquinoline) aluminum based microcavity on
device thickness and the emission layer position,” Thin Solid
Films 489 (1-3), 235-244 (2005)
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Automated Techniques for Optical & Electrical Characterisation of Vertical-Cavity Surface-Emitting Lasers & VCSEL ArraysWe have developed a novel system for comprehensive testing of light emitters used in optical communication and sensing systems. Our system allows for electrical (DC and RF) and optical measurements on semiconductor lasers such as Light-Current, Current-Voltage, optical spectrum, intensity noise spectrum and CCD camera beam profiling. System allows for spectrally, spatially and polarization resolved imaging of coexisting transverse modes in surface-normal and in-plane light emitters. Representative publications: C. J. O’Brien, M. L. Majewski, and A. D. Rakić, “A Critical Comparison of High-Speed VCSEL Characterization Techniques,” J. Lightwave Technol., 25 (2), 597-605 (2007) DOI 10.1109/JLT.2006.889362 |
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